Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force.

Our most common projects involve morphometric and densitometric analyses of mineralized tissues from model organisms. In addition to bones and teeth, we provide nondestructive scans of biomaterials, museum artifacts, and industrial products with micrometer-scale resolution.

The Cell Culture Facility, supports research by providing cell cultures, The facility provides cell cultures for our researchers, provides materials for observation and detailed information. In addition, our cell culture facility allows use of tools for researchers who are using cells provided by the facility, to use on site.